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Central Feature Network Enables Accurate Detection of Both Small and Large Particles in Cryo-Electron Tomography

Yao-Yu Wang Xiao-Hua Wan Cheng Chen Fa Zhang Xue-Feng Cui

Journal of Computer Science & Technology2025，Vol.40Issue(3)：P.792-804,13.

Journal of Computer Science & Technology2025，Vol.40Issue(3)：P.792-804,13.DOI:10.1007/s11390-025-4816-2

Central Feature Network Enables Accurate Detection of Both Small and Large Particles in Cryo-Electron Tomography

Yao-Yu Wang ¹Xiao-Hua Wan ²Cheng Chen ³Fa Zhang ²Xue-Feng Cui³

作者信息

1. Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100190,China University of Chinese Academy of Sciences,Beijing 101408,China
2. School of Medical Technology,Beijing Institute of Technology,Beijing 100081,China
3. School of Computer Science and Technology,Shandong University,Qingdao 266237,China
折叠

摘要

关键词

particle detection/cryo-electron tomography/pattern recognition/deep learning

分类

信息技术与安全科学

引用本文复制引用

Yao-Yu Wang,Xiao-Hua Wan,Cheng Chen,Fa Zhang,Xue-Feng Cui..Central Feature Network Enables Accurate Detection of Both Small and Large Particles in Cryo-Electron Tomography[J].Journal of Computer Science & Technology,2025,40(3):P.792-804,13.

基金项目

supported by the National Key Research and Development Program of China under Grant No.2021YFF0704300 （）

the National Natural Science Foundation of China under Grant Nos.32241027,62072441,and 62072283. （）

Journal of Computer Science & Technology

ISSN：1000-9000

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