光:科学与应用(英文版)2025,Vol.14Issue(8):2187-2197,11.DOI:10.1038/s41377-025-01872-4
Pockels laser directly driving ultrafast optical metrology
Pockels laser directly driving ultrafast optical metrology
摘要
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Shixin Xue,Heming Wang,Chao Xiang,John E.Bowers,Qiang Lin,Mingxiao Li,Raymond Lopez-rios,Jingwei Ling,Zhengdong Gao,Qili Hu,Tian Qiu,Jeremy Staffa,Lin Chang..Pockels laser directly driving ultrafast optical metrology[J].光:科学与应用(英文版),2025,14(8):2187-2197,11.基金项目
The authors thank Dr.Joel Guo and Linrui Tan for their valuable discussions and help with the experiment.This work is supported in part by the Defense Advanced Research Projects Agency(DARPA)LUMOS program under Agreement No.HR001-20-2-0044,and the National Science Foundation(NSF)(OMA-2138174,ECCS-2231036,OSI-2329017).This work was performed in part at the Cornell NanoScale Facility,a member of the National Nanotechnology Coordinated Infrastructure(National Science Foundation,ECCS-1542081) (DARPA)
at the Cornell Center for Materials Research(National Science Foundation,Grant No.DMR-1719875) (National Science Foundation,Grant No.DMR-1719875)
and in the UCSB Nanofabrication Facility,an open access laboratory. ()