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Dynamic avalanche reliability enhancement of FS-IGBT under unclamped inductive switching

Jingping Zhang Houcai Luo Huan Wu Bofeng Zheng Xianping Chen

半导体学报（英文版）2025，Vol.46Issue(9)：19-31,13.

半导体学报（英文版）2025，Vol.46Issue(9)：19-31,13.DOI:10.1088/1674-4926/25020006

Dynamic avalanche reliability enhancement of FS-IGBT under unclamped inductive switching

Jingping Zhang ¹Houcai Luo ¹Huan Wu ¹Bofeng Zheng ¹Xianping Chen²

作者信息

1. Key Laboratory of Optoelectronic Technology&Systems,Chongqing University,Chongqing 400044,China
2. Key Laboratory of Optoelectronic Technology&Systems,Chongqing University,Chongqing 400044,China||Key Laboratory of Power Transmission Equipment&System Security and New Technology,Chongqing University,Chongqing 400044,China
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摘要

关键词

FS-IGBT/dynamic avalanche/UIS/reliability/circuit parameters

Key words

FS-IGBT/dynamic avalanche/UIS/reliability/circuit parameters

引用本文复制引用

Jingping Zhang,Houcai Luo,Huan Wu,Bofeng Zheng,Xianping Chen..Dynamic avalanche reliability enhancement of FS-IGBT under unclamped inductive switching[J].半导体学报（英文版）,2025,46(9):19-31,13.

基金项目

This work is supported in part by the National Natural Sci-ence Foundation of China under Grant 62071073,in part by the Fundamental Research Funds for Central Universities under Grant 2023CDJXY-041,and in part by the Foundation from Guangxi Key Laboratory of Optoelectronic Information Processing under Grant GD20201. （）

半导体学报（英文版）

ISSN：1674-4926

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