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Deep learning for sub-ångström-resolution imaging in uncorrected scanning transmission electron microscopy

Zanlin Qiu Linfeng Zhang Weinan E Xiaoxu Zhao Jin Zhang Yuan Meng Junxian Li Yanhui Hong Ning Li Xiaocang Han Yu Liang Wing Ni Cheng Guolin Ke

国家科学评论（英文版）2025，Vol.12Issue(8)：118-129,12.

国家科学评论（英文版）2025，Vol.12Issue(8)：118-129,12.DOI:10.1093/nsr/nwaf235

Deep learning for sub-ångström-resolution imaging in uncorrected scanning transmission electron microscopy

Zanlin Qiu ¹Linfeng Zhang ²Weinan E ³Xiaoxu Zhao ⁴Jin Zhang ⁵Yuan Meng ¹Junxian Li ¹Yanhui Hong ⁶Ning Li ¹Xiaocang Han ¹Yu Liang ¹Wing Ni Cheng ¹Guolin Ke⁶

作者信息

1. School of Materials Science and Engineering,Peking University,Beijing 100871,China
2. DP Technology,Beijing 100080,China||AI for Science Institute,Beijing 100084,China
3. AI for Science Institute,Beijing 100084,China||Center for Machine Learning Research,Peking University,Beijing 100871,China||School of Mathematical Sciences,Peking University,Beijing 100871,China
4. School of Materials Science and Engineering,Peking University,Beijing 100871,China||AI for Science Institute,Beijing 100084,China
5. School of Materials Science and Engineering,Peking University,Beijing 100871,China||Center for Nanochemistry,Beijing Science and Engineering Center for Nanocarbons,Beijing National Laboratory for Molecular Sciences,College of Chemistry and Molecular Engineering,Peking University,Beijing 100871,China||School of Advanced Materials,Peking University Shenzhen Graduate School,Shenzhen 518055,China
6. DP Technology,Beijing 100080,China
折叠

摘要

关键词

transmission electron microscopy/artificial intelligence/super-resolution imaging/denoising diffusion probabilistic model

Key words

transmission electron microscopy/artificial intelligence/super-resolution imaging/denoising diffusion probabilistic model

引用本文复制引用

Zanlin Qiu,Linfeng Zhang,Weinan E,Xiaoxu Zhao,Jin Zhang,Yuan Meng,Junxian Li,Yanhui Hong,Ning Li,Xiaocang Han,Yu Liang,Wing Ni Cheng,Guolin Ke..Deep learning for sub-ångström-resolution imaging in uncorrected scanning transmission electron microscopy[J].国家科学评论（英文版）,2025,12(8):118-129,12.

基金项目

This work was supported by the National Key R&D Program of China(2024YFE0109200 and 2024YFA1410000),Beijing Natural Science Foundation(JQ24010 and Z220020)and the National Natural Science Foundation of China(52273279 and 22494643). （2024YFE0109200 and 2024YFA1410000）

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