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有源层厚度对Al-Zn-Sn-O薄膜晶体管和反相器性能的影响

库来哲 王超 郭亮 王杰阳 初学峰 杨帆 郝云鹏 高寒松 赵洋

液晶与显示2025,Vol.40Issue(9):1258-1267,10.
液晶与显示2025,Vol.40Issue(9):1258-1267,10.DOI:10.37188/CJLCD.2025-0133

有源层厚度对Al-Zn-Sn-O薄膜晶体管和反相器性能的影响

Influence of active layer thickness on performance of Al-Zn-Sn-O thin-film transistors and inverters

库来哲 1王超 1郭亮 1王杰阳 1初学峰 1杨帆 1郝云鹏 1高寒松 1赵洋1

作者信息

  • 1. 吉林建筑大学 寒地建筑综合节能教育部重点实验室,吉林 长春 130118||吉林建筑大学 电气与计算机学院,吉林 长春 130118
  • 折叠

摘要

Abstract

To investigate the influence of active layer thickness on the performance of aluminum zinc tin oxide(AZTO)thin-film transistors(TFTs)and inverters,and to promote their application in logic circuits,this paper prepared AZTO thin films with different thicknesses by radio frequency magnetron sputtering.These films were used as active layers to construct bottom-gate top-contact AZTO-TFT devices.The microstructure and composition of the films were characterized by field emission scanning electron microscopy(SEM)and X-ray photoelectron spectroscopy(XPS),and the electrical properties of the devices were tested.It was found that with the increase of the thickness of the AZTO active layer,the oxygen vacancy concentration gradually increased.Moderate oxygen vacancies can weaken the scattering effect of defects and impurities on carriers,reduce the transmission resistance,and thus improve the field-effect mobility.At the same time,the device can pass more carriers in the on-state,resulting in an increase in the source-drain current and the on/off ratio.The results showed that when the thickness of the active layer was 82 nm,the quality of the AZTO film was the best,and the device performance was optimal,with a field-effect mobility of 7.47 cm2·V-1·s-1,a threshold voltage of 14.25 V,a subthreshold swing of 1.35 V/dec,and a current on/off ratio of 6.16×107.The resistor-loaded inverter prepared under this optimized condition achieved a high gain of 8.8 at a supply voltage(VDD)of 25 V,and had full-swing characteristics and good noise margin,which can effectively drive the next-stage components of the logic circuit.

关键词

薄膜晶体管/AZTO/电阻负载型反相器

Key words

thin-film transistors/AZTO/resistive-load inverters

分类

信息技术与安全科学

引用本文复制引用

库来哲,王超,郭亮,王杰阳,初学峰,杨帆,郝云鹏,高寒松,赵洋..有源层厚度对Al-Zn-Sn-O薄膜晶体管和反相器性能的影响[J].液晶与显示,2025,40(9):1258-1267,10.

基金项目

国家自然科学基金(No.62374073) (No.62374073)

吉林省科技发展计划(No.YDZJ202301ZYTS489) Supported by National Natural Science Foundation of China(No.62374073) (No.YDZJ202301ZYTS489)

Science and Technology Development Plan of Jilin Province(No.YDZJ202301ZYTS489) (No.YDZJ202301ZYTS489)

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