首页|期刊导航|International Journal of Extreme Manufacturing|Tailoring the number of lines for IGO-channel 2T0C DRAM comparable to conventional 2-line operation 1T1C structure for highly scaled cell volume
Tailoring the number of lines for IGO-channel 2T0C DRAM comparable to conventional 2-line operation 1T1C structure for highly scaled cell volume
Jae-Hyeok Kwag Su-Hwan Choi Daejung Kim Jun-Yeoub Lee Taewon Hwang Hye-Jin Oh Chang-Kyun Park Jin-Seong Park
International Journal of Extreme Manufacturing2025,Vol.7Issue(5):P.404-414,11.
International Journal of Extreme Manufacturing2025,Vol.7Issue(5):P.404-414,11.DOI:10.1088/2631-7990/add7a3
Tailoring the number of lines for IGO-channel 2T0C DRAM comparable to conventional 2-line operation 1T1C structure for highly scaled cell volume
摘要
关键词
capacitor-less 2T0C DRAM/cell design and operation/atomic layer deposition/oxide semiconductor/monolithic stacked分类
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Jae-Hyeok Kwag,Su-Hwan Choi,Daejung Kim,Jun-Yeoub Lee,Taewon Hwang,Hye-Jin Oh,Chang-Kyun Park,Jin-Seong Park..Tailoring the number of lines for IGO-channel 2T0C DRAM comparable to conventional 2-line operation 1T1C structure for highly scaled cell volume[J].International Journal of Extreme Manufacturing,2025,7(5):P.404-414,11.基金项目
supported by the Technology Innovation Program(Grant Nos.20017382 and 20023023) (Grant Nos.20017382 and 20023023)
funded by the Ministry of Trade,Industry&Energy(MOTIE,Republic of Korea) (MOTIE,Republic of Korea)
supported by a National Research Foundation of Korea(NRF)grant funded by the Korean Government(MSIT)(Grant No.RS-2023-00260527). (NRF)