Nanotechnology and Precision Engineering2025，Vol.8Issue(3)：P.131-137,7.DOI:10.1063/10.0036132
A self-correction algorithm for positioning error in sequential point bending tests of a microbeam for Young’s modulus based on atomic force microscopy
Yuxin Liu 1Linyan Xu1
作者信息
- 1. State Key Laboratory of Precision Measurement Technology and Instruments,Tianjin University,Tianjin 300072,China
- 折叠
摘要
关键词
Microbeam structure/Young’s modulus/Sequential point bending test/Self-correcting positioning error/Atomic force microscopy分类
机械制造引用本文复制引用
Yuxin Liu,Linyan Xu..A self-correction algorithm for positioning error in sequential point bending tests of a microbeam for Young’s modulus based on atomic force microscopy[J].Nanotechnology and Precision Engineering,2025,8(3):P.131-137,7.
