集成电路与嵌入式系统2025，Vol.25Issue(11)：31-37,7.DOI:10.20193/j.ices2097-4191.2025.0069
一种面向SoC的高效DDR4调试与测试方法
An efficient DDR4 debugging and testing method for SoC designs
摘要
Abstract
With semiconductor processes advancing into the nanometer scale,SoC chip complexity has surged dramatically,imposing sig-nificant challenges to the efficiency and flexibility of conventional debugging approaches.As a critical component for SoC-external system interaction,the functional correctness and performance stability of DDR memory are paramount to chip reliability.This paper proposes an intelligent debugging solution based on GDB-OpenOCD co-design to address the debugging challenges of high-speed DDR controllers in modern SoCs.By deeply integrating GDB and OpenOCD frameworks,the solution achieves unified JTAG management for multi-de-vice systems and enables cross-module parallel debugging,substantially enhancing SoC observability.To tackle DDR debugging difficul-ties,we innovatively develop a modular parameter configuration architecture that supports dynamic reconfiguration of controller timing parameters,reducing debugging cycles by 50％.Furthermore,a systematic verification framework is established,incorporating a com-prehensive memory stress test suite covering 16 test scenarios to thoroughly validate DDR functionality and performance.Through this hardware-software co-design approach,the solution significantly improves debugging efficiency and controllability,providing key techni-cal references for autonomous debugging in domestic chips.关键词
调试系统/多核SoC/DDR/存储接口电路/存储系统Key words
debugging system/multi-core System on Chip/DDR/memory interface circuit/memory system分类
计算机与自动化引用本文复制引用
蒋艳德,马敬博,张光达,王冬升,徐实,裴秉玺,王会权..一种面向SoC的高效DDR4调试与测试方法[J].集成电路与嵌入式系统,2025,25(11):31-37,7.基金项目
中国国家自然科学基金(62372461) （62372461）
智强基金 （）
