集成电路与嵌入式系统2025，Vol.25Issue(11)：54-61,8.DOI:10.20193/j.ices2097-4191.2025.0055
基于失效物理的SiP可靠性评价标准研究
Research on reliability evaluation standards for system-in-package on physics-of-failure
刘莹莹 1王志慧 1刘文宝 1付琬月 1刘沛2
作者信息
- 1. 中国航天标准化与产品保证研究院,北京 100071
- 2. 北京大学集成电路学院,北京 100871
- 折叠
摘要
Abstract
Based on physics-of-failure(PoF)analysis methods,this paper proposes a standard for SiP reliability evaluation.This paper completes an analysis of the applicability of domestic and international SiP reliability evaluation methods based on PoF.Utilizing com-puter simulation technology,a SiP reliability evaluation framework is established,including model construction,stress profile analysis,reliability prediction,and lifetime forecasting.The core content of this reliability evaluation standard is identified,covering evaluation processes,work contents,and detailed requirements.The application in an actual SiP product is also explored,demonstrating its high effectiveness and engineering applicability.The results show good consistency with those from accelerated lifespan testing.The research outcomes help address current challenges in SiP reliability evaluation,such as the lack of unified and effective methods,poor targeting of evaluations,long test cycles,insufficient failure datas,and high experimental costs.关键词
SiP/可靠性评价/仿真/失效物理(PoF)Key words
SiP/reliability evaluation/simulation/physics-of-failure(PoF)分类
电子信息工程引用本文复制引用
刘莹莹,王志慧,刘文宝,付琬月,刘沛..基于失效物理的SiP可靠性评价标准研究[J].集成电路与嵌入式系统,2025,25(11):54-61,8.
