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基于UVM的AHB-Lite eFlash控制器验证平台设计

刘光杰 刘伟景 赖琳晖

集成电路与嵌入式系统2025,Vol.25Issue(11):62-70,9.
集成电路与嵌入式系统2025,Vol.25Issue(11):62-70,9.DOI:10.20193/j.ices2097-4191.2025.0058

基于UVM的AHB-Lite eFlash控制器验证平台设计

Design of AHB-Lite eFlash controller verification platform based on UVM

刘光杰 1刘伟景 1赖琳晖2

作者信息

  • 1. 上海电力大学电子与信息工程学院,上海 201306
  • 2. 上海芯聚辉集成电路有限公司,上海 201203
  • 折叠

摘要

Abstract

With the increasing demand for non-volatile storage in embedded systems,the functional verification of embedded flash(eFlash)controllers has become a crucial step to ensure system reliability.In response to the low efficiency and poor timing compatibility of traditional directed testing in eFlash controller verification,this paper designs and implements an efficient verification platform for eFlash controllers based on the Universal Verification Methodology(UVM)and oriented to the AHB-Lite bus.The platform utilizes the core components of UVM to achieve a hierarchical architecture,and employs automated scripts and an integrated register model(RAL),adopting random constraint testing and coverage-driven strategies.This ensures verification completeness while shortening the verification cycle.The verification results show that this verification platform can effectively verify the various functions of the eFlash controller,achie-ving 100%code coverage and 100%functional coverage.

关键词

eFlash控制器/UVM/AHB-Lite/寄存器模型/验证平台/功能覆盖率/代码覆盖率

Key words

eFlash controller/UVM/AHB-Lite/register model/verification platform/functional coverage/code coverage

分类

计算机与自动化

引用本文复制引用

刘光杰,刘伟景,赖琳晖..基于UVM的AHB-Lite eFlash控制器验证平台设计[J].集成电路与嵌入式系统,2025,25(11):62-70,9.

集成电路与嵌入式系统

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