计算机工程与应用2025，Vol.61Issue(23)：72-89,18.DOI:10.3778/j.issn.1002-8331.2503-0296
嵌入式设备固件模糊测试技术综述
Survey of Fuzz Testing Embedded Device Firmwares
摘要
Abstract
To ensure the security of embedded devices,the firmware of embedded devices must be adequately tested to detect and fix the vulnerabilities in time.In recent years,researchers have applied fuzz testing to the testing of embedded device firmwares,effectively improving the efficiency of testing.This paper summarizes research results on fuzz testing of embedded device firmwares from 2014 to 2024,divides the fuzz testing process for embedded device firmwares into three stages:preprocessing,test environment establishment,and fuzz testing execution,then introduces the research results of each stage.In addition,the paper discusses the datasets and evaluation metrics for existing fuzz testing of em-bedded device firmwares,and looks forward to the future research direction of fuzz testing for embedded device firmwares.关键词
模糊测试/嵌入式设备固件测试/嵌入式安全/固件仿真/固件模糊测试Key words
fuzz testing/embedded device firmware testing/embedded security/firmware emulation/firmware fuzz testing分类
信息技术与安全科学引用本文复制引用
陈菁菁,王正武,兰文尉,张瑞宸,张亚东,崔展齐..嵌入式设备固件模糊测试技术综述[J].计算机工程与应用,2025,61(23):72-89,18.基金项目
北京信息科技大学"勤信人才"培育计划项目(QXTCP B202406) （QXTCP B202406）
北京控制工程研究所高可信嵌入式软件工程技术实验室开放基金(LHCESET202307). （LHCESET202307）
