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Simulation and fabrication of vertical channel transistors with self-aligned high-κ metal gates using ion implantation for source/drain doping

Penghui Sun Yongkui Zhang Jun Luo

半导体学报(英文版)2025,Vol.46Issue(12):58-66,9.
半导体学报(英文版)2025,Vol.46Issue(12):58-66,9.DOI:10.1088/1674-4926/25030043

Simulation and fabrication of vertical channel transistors with self-aligned high-κ metal gates using ion implantation for source/drain doping

Simulation and fabrication of vertical channel transistors with self-aligned high-κ metal gates using ion implantation for source/drain doping

Penghui Sun 1Yongkui Zhang 2Jun Luo1

作者信息

  • 1. School of Integrated Circuits,University of Chinese Academy of Sciences,Beijing 100049,China||Integrated Circuit Advanced Process R&D Center,Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
  • 2. Integrated Circuit Advanced Process R&D Center,Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China
  • 折叠

摘要

关键词

vertical channel transistor/source/drain ion implantation/on-state current/dummy gates

Key words

vertical channel transistor/source/drain ion implantation/on-state current/dummy gates

引用本文复制引用

Penghui Sun,Yongkui Zhang,Jun Luo..Simulation and fabrication of vertical channel transistors with self-aligned high-κ metal gates using ion implantation for source/drain doping[J].半导体学报(英文版),2025,46(12):58-66,9.

半导体学报(英文版)

1674-4926

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