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氧化镓功率器件性能温度响应的仿真与优化

谢玉环 瞿振宇 赵天成 徐文慧 游天桂 杨义

有色金属材料与工程2025,Vol.46Issue(6):49-56,8.
有色金属材料与工程2025,Vol.46Issue(6):49-56,8.DOI:10.13258/j.cnki.nmme.20241129001

氧化镓功率器件性能温度响应的仿真与优化

Simulation and optimization of Ga2O3 power device performance temperature response

谢玉环 1瞿振宇 2赵天成 2徐文慧 2游天桂 2杨义3

作者信息

  • 1. 上海理工大学 材料与化学学院,上海 200093||中国科学院上海微系统与信息技术研究所,上海 200050
  • 2. 中国科学院上海微系统与信息技术研究所,上海 200050
  • 3. 上海理工大学 材料与化学学院,上海 200093
  • 折叠

摘要

Abstract

To address the issue of the low intrinsic thermal conductivity of Ga2O3,the intelligent ion-cutting technique is employed to heterogeneously integrate Ga2O3 thin films with high-thermal-conductivity substrates,thereby enhancing the device's heat dissipation capability.In this work,we utilize Sentaurus TCAD to conduct systematic simulations and studies on the temperature response of both homoepitaxial Ga2O3 devices and Ga2O3-on-SiC(GaO/SiC)power devices.Additionally,using COMSOL Multiphysics,we simulate the temperature distribution of GaO/SiC MOSFETs under various conditions and analyze the impact of passivation layers,intermediate adhesion layers,and substrate types on device heat dissipation.The results demonstrate that,under the same power conditions,compared with the homoepitaxial Ga2O3 MOSFET,the GaO/SiC MOSFET exhibits a peak temperature reduction of~202 K,showcasing a significant mitigation of the self-heating effect in Ga2O3 devices through integration with high-thermal-conductivity substrates.Moreover,GaO/SiC MOSFETs exhibit superior performance compared to homoepitaxial Ga2O3 MOSFETs in terms of threshold voltage,on-off ratio,on-resistance,and breakdown voltage.Furthermore,the presence of an SiO2/SiNx intermediate adhesion layer for bonding results in a 16 K increase in the maximum device temperature rise.Increasing the thickness of the AlN passivation layer can lead to a modest reduction in the maximum device temperature rise.In contrast,Ga2O3 devices integrated with diamond(a higher thermal conductivity substrate)exhibit a more pronounced temperature rise reduction(~330 K)compared to homoepitaxial devices.

关键词

氧化镓/异质集成/Sentaurus TCAD/COMSOL/功率器件/温度响应

Key words

gallium oxide/heterogeneous integration/Sentaurus TCAD/COMSOL/power device/temperature response

分类

信息技术与安全科学

引用本文复制引用

谢玉环,瞿振宇,赵天成,徐文慧,游天桂,杨义..氧化镓功率器件性能温度响应的仿真与优化[J].有色金属材料与工程,2025,46(6):49-56,8.

基金项目

上海市战略前沿专项(24DP1500100) (24DP1500100)

上海市"科技创新行动计划"启明星(22QA1410700) (22QA1410700)

有色金属材料与工程

2096-2983

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