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Influencing factors of noise characteristics in EBCMOS with uniformly doped P-type substrates

Xinyue He Gangcheng Jiao Hongchang Cheng Tianjiao Lu Ye Li De Song Weijun Chen

半导体学报(英文版)2026,Vol.47Issue(1):29-40,12.
半导体学报(英文版)2026,Vol.47Issue(1):29-40,12.DOI:10.1088/1674-4926/25030039

Influencing factors of noise characteristics in EBCMOS with uniformly doped P-type substrates

Influencing factors of noise characteristics in EBCMOS with uniformly doped P-type substrates

Xinyue He 1Gangcheng Jiao 2Hongchang Cheng 2Tianjiao Lu 1Ye Li 1De Song 1Weijun Chen1

作者信息

  • 1. School of Science,Changchun University of Science and Technology,Changchun 130022,China
  • 2. Science and Technology on Low-Light-Level Night Vision Laboratory,Xi'an 710065,China
  • 折叠

摘要

关键词

EBCMOS/dark current electron number/gain/SNR

Key words

EBCMOS/dark current electron number/gain/SNR

引用本文复制引用

Xinyue He,Gangcheng Jiao,Hongchang Cheng,Tianjiao Lu,Ye Li,De Song,Weijun Chen..Influencing factors of noise characteristics in EBCMOS with uniformly doped P-type substrates[J].半导体学报(英文版),2026,47(1):29-40,12.

半导体学报(英文版)

1674-4926

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