首页|期刊导航|半导体学报(英文版)|A deep-junction single-photon detector with field polysilicon gate structure for increased photon detection efficiency and reduced dark count noise
半导体学报(英文版)2026,Vol.47Issue(1):64-71,8.DOI:10.1088/1674-4926/25060004
A deep-junction single-photon detector with field polysilicon gate structure for increased photon detection efficiency and reduced dark count noise
A deep-junction single-photon detector with field polysilicon gate structure for increased photon detection efficiency and reduced dark count noise
摘要
关键词
single-photon avalanche diode(SPAD)/fill factor(FF)/photon detection efficiency(PDE)/dark count rate(DCR)Key words
single-photon avalanche diode(SPAD)/fill factor(FF)/photon detection efficiency(PDE)/dark count rate(DCR)引用本文复制引用
Zhentao Ni,Dajing Bian,Haoxiang Jiang,Xiaoming Huang,Yue Xu..A deep-junction single-photon detector with field polysilicon gate structure for increased photon detection efficiency and reduced dark count noise[J].半导体学报(英文版),2026,47(1):64-71,8.基金项目
This work has been supported by the National Natural Science Foundation of China under Grant 62171233,the Natural Science Foundation of China,Jiangsu Province under Grant BK20241891,and the Jiangsu Province Gradua-te Research and Practice Innovation Plan under Grants SJCX24_0313 and KYCX24_1169. ()