山东国土资源2026，Vol.42Issue(1)：51-57,7.DOI:10.12128/j.issn.1672-6979.2026.01.006
SHRIMP V型离子探针样品装载流程制备要求与优化方案
Sample Loading Process Preparation Requirements and Optimization Solutions for SHRIMP V Ion Probe
摘要
Abstract
Since the official launch of the generation V Sensitive and High Resolution Ion Micro Probe(SHRIMP V)on May 28,2023,it has been running for a year and a half,with a total of more than 12000 test data points.In addition to conventional zircon oxygen isotopes,some exploratory work has also been conducted on the oxygen isotopes of quartz and apatite,sulfur isotopes of pyrite,and silicon isotopes of zircon.More than ten batches of external testing have been conducted,serving major geological universities and research institutes in China.In this paper,SHRIMP V sample inlet system and sample preparation re-quirements have been introduced briefly.关键词
二次离子质谱仪/SHRIMP/进样系统/样品制备Key words
SIMS/SHRIMP/sample inlet system/sample preparation分类
天文与地球科学引用本文复制引用
耿科,刘兰海,单尔豪,武帅,李大鹏,张岩,尉鹏飞,张超,刘强,蔡娜,薛颖瑜,李森,李鑫,卞霄..SHRIMP V型离子探针样品装载流程制备要求与优化方案[J].山东国土资源,2026,42(1):51-57,7.基金项目
本文为山东省重点研发计划(2023CXGC011001、2022CXPT047)、国家自然科学基金(42172094,42272104,42503010)、山东省自然科学基金(ZR2024MD059,ZR2024MD079,ZR2025QC1058)、新一轮找矿突破战略行动科技支撑项目(ZKKJ202405)联合资助 （2023CXGC011001、2022CXPT047）
