物理与工程2025，Vol.35Issue(6)：133-137,5.
通用X射线衍射仪测量单晶样品的实验方法
EXPERIMENTAL METHOD FOR MEASURING SINGLE CRYSTAL SAMPLES BY UNIVERSAL X-RAY DIFFRACTOMETER
徐子晖 1孙莹 1袁秀良 1安世海1
作者信息
- 1. 北京航空航天大学物理学院,北京 102206
- 折叠
摘要
Abstract
X-ray diffraction(XRD)analysis is a fundamental means of characterizing the structure of materials and is indispensable in the research of disciplines such as materials sci-ence,physics,and chemistry.Compared with polycrystals,single crystals have more impor-tant research and application value in frontier fields such as semiconductors,nonlinear optics,superconductivity,and topological insulators.However,at present,most universities and re-search institutions are equipped with general-purpose X-ray diffractometers,and the testing steps for single crystal samples are relatively complex.This paper uses a Bruker D8 Advance diffractometer to conduct X-ray diffraction experiments on Si(001)single crystals and elabo-rates on the experimental steps and results,providing a reference for teaching and research work involving X-ray diffraction experiments.关键词
X射线衍射/单晶/摇摆曲线Key words
X-ray diffraction/single-crystal/rocking curve引用本文复制引用
徐子晖,孙莹,袁秀良,安世海..通用X射线衍射仪测量单晶样品的实验方法[J].物理与工程,2025,35(6):133-137,5.
