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应力释放对InGaN/GaN量子阱有源区发光特性的影响机制

郭一庸 武智波 徐昊一 李长富 高渊 冀子武

聊城大学学报(自然科学版)2026,Vol.39Issue(2):249-254,6.
聊城大学学报(自然科学版)2026,Vol.39Issue(2):249-254,6.DOI:10.19728/j.issn1672-6634.2025100010

应力释放对InGaN/GaN量子阱有源区发光特性的影响机制

Mechanism of strain relaxation effects upon luminescence characteristics of InGaN/GaN quantum well active regions

郭一庸 1武智波 1徐昊一 2李长富 2高渊 1冀子武3

作者信息

  • 1. 山东大学 集成电路学院,山东 济南 250100
  • 2. 泰山学院 物理与电子工程学院,山东 泰安 271021
  • 3. 中国电子科技集团公司 第十三研究所,河北 石家庄 050051
  • 折叠

摘要

Abstract

Two different green-emitting InGaN/GaN quantum well(QW)structures,with and without a strain-relieving layer,were prepared,and their injection current-dependence of electroluminescence(EL)and temperature dependence of photoluminescence(PL)were investigated.The EL measurements indica-ted that,comparing with the QW structure without a strain-relieving layer(S1),the QW structure with a strain-relieving layer(S2)exhibits a stronger EL intensity,a significant energy redshift,and a smaller ef-ficiency droop.In contrast,the PL measurements indicated that S2 has fewer non-radiative centers,a lar-ger activation energy,and a higher internal quantum efficiency than S1.These results reflected the fact that the introduction of the strain-relieving layer not only relieves the stress in the active region and en-hances the incorporation of Indium atoms,but also improves the structural quality of the active region,strengthens the carrier localization effect,and suppresses electron leakage.Such explanation is consistent with the high-resolution X-ray diffraction measurements,which have shown that S2 has a less dislocation density and better structural/crystalline quality than S1.

关键词

InGaN/GaN量子阱/应力释放层/电致发光/光致发光/效率下垂/内量子效率

Key words

InGaN/GaN quantum well/strain-relieving layer/electroluminescence/photoluminescence/efficiency droop/internal quantum efficiency

分类

通用工业技术

引用本文复制引用

郭一庸,武智波,徐昊一,李长富,高渊,冀子武..应力释放对InGaN/GaN量子阱有源区发光特性的影响机制[J].聊城大学学报(自然科学版),2026,39(2):249-254,6.

基金项目

国家自然科学基金项目(52272157,51872167)资助 (52272157,51872167)

聊城大学学报(自然科学版)

1672-6634

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