首页|期刊导航|Journal of Materiomics|Enhancing ferroelectric properties of Hf_(0.5)Zr_(0.5)O_(2)thin films using the HfN/TiN and W/TiN bi-layer bottom electrodes
Enhancing ferroelectric properties of Hf_(0.5)Zr_(0.5)O_(2)thin films using the HfN/TiN and W/TiN bi-layer bottom electrodes
Han Sol Park Joong Chan Shin Kyung Do Kim Seong Jae Shin Jae Hee Song Seung Kyu Ryoo In Soo Lee Suk Hyun Lee Hyunwoo Nam Cheol Seong Hwang
Journal of Materiomics2025,Vol.11Issue(6):P.252-262,11.
Journal of Materiomics2025,Vol.11Issue(6):P.252-262,11.DOI:10.1016/j.jmat.2025.101109
Enhancing ferroelectric properties of Hf_(0.5)Zr_(0.5)O_(2)thin films using the HfN/TiN and W/TiN bi-layer bottom electrodes
摘要
关键词
Ferroelectric/Hf0.5Zr0.5O2/Coefficient of thermal expansion/Tensile stress/Bi-layer bottom electrode分类
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Han Sol Park,Joong Chan Shin,Kyung Do Kim,Seong Jae Shin,Jae Hee Song,Seung Kyu Ryoo,In Soo Lee,Suk Hyun Lee,Hyunwoo Nam,Cheol Seong Hwang..Enhancing ferroelectric properties of Hf_(0.5)Zr_(0.5)O_(2)thin films using the HfN/TiN and W/TiN bi-layer bottom electrodes[J].Journal of Materiomics,2025,11(6):P.252-262,11.基金项目
supported by the National Research Foundation of Korea(Grant No.2020R1A3B2079882). (Grant No.2020R1A3B2079882)