首页|期刊导航|Nano Research|Dielectric engineering for scaling down two-dimensional field-effect transistors
Nano Research2026,Vol.19Issue(2):P.805-833,29.DOI:10.26599/NR.2025.94908077
Dielectric engineering for scaling down two-dimensional field-effect transistors
摘要
关键词
dielectric engineering/two-dimensional field-effect transistors/scaling down/equivalent oxide thickness/interface quality分类
信息技术与安全科学引用本文复制引用
Chaoqun Jiang,Jing Hu,Tao Yu,Xiangdong Xu,Yong Xu,Zhihao Yu,Zhongzhong Luo..Dielectric engineering for scaling down two-dimensional field-effect transistors[J].Nano Research,2026,19(2):P.805-833,29.基金项目
support from the National Key R&D Program of China(No.2024YFB4405300) (No.2024YFB4405300)
the Natural Science Foundation of Jiangsu Province(No.BK20220397) (No.BK20220397)
the National Natural Science Foundation of China(Nos.62204130,62474094,and T2322014) (Nos.62204130,62474094,and T2322014)
NSFC-DFG“Mobility”project(No.M0604) (No.M0604)
Guangdong Provincial Key Laboratory of Integrated Circuit Technology and Products Based on Fully Depleted Silicon On Insulator(2024)(No.2024B1212020005) (2024)
Guangdong Province Pearl-River Talent Program(No.2023JC11X250). (No.2023JC11X250)