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FFD-YOLO:面向小目标与复杂背景的液晶屏缺陷检测

山宏刚 倪奕麟 蔡建刚 朱军 廖泽威 戚顺楠

液晶与显示2026,Vol.41Issue(2):208-221,14.
液晶与显示2026,Vol.41Issue(2):208-221,14.DOI:10.37188/CJLCD.2025-0220

FFD-YOLO:面向小目标与复杂背景的液晶屏缺陷检测

FFD-YOLO:LCD screen defect detection for small targets and complex backgrounds

山宏刚 1倪奕麟 1蔡建刚 1朱军 1廖泽威 2戚顺楠2

作者信息

  • 1. 上海海关机电产品检测技术中心,上海 201210
  • 2. 上海电机学院 机械学院,上海 201306
  • 折叠

摘要

Abstract

Surface defects on liquid crystal displays(LCDs)impair appearance and reliability,presenting challenges such as wide-scale variations,complex backgrounds,and difficulty in detecting small targets.This paper proposes FFD-YOLO,an LCD defect detection algorithm based on the lightweight YOLOv8n framework.The algorithm uses the FasterNet backbone to enhance feature extraction.It designs the Feature Pyramid Shared Convolution(FPSC)module,which uses multi-expansion-rate convolutions and shared convolutional mechanisms to enhance multi-scale feature modeling.Additionally,it proposes the Multi-Scale Adaptive Convolution Module(MACM),which employs dynamic convolution weights and multi-scale convolution kernels to enhance the representation of small objects and stability in complex backgrounds.Experimental results demonstrate that on the self-built industrial-grade LCD-NET dataset,FFD-YOLO achieves 5.0%,4.7%,and 3.2%improvements in Precision,Recall,and mAP50,respectively,compared to baseline models,with a 6.4%boost in accuracy for detecting small stain-type objects.These results demonstrate that FFD-YOLO significantly enhances LCD defect detection performance while maintaining lightweight efficiency,offering an effective and reliable solution for industrial vision inspection systems.

关键词

液晶屏/缺陷检测/特征金字塔共享卷积/多尺度自适应卷积/YOLOv8

Key words

liquid crystal display/defect detection/feature pyramid shared convolutions/multi-scale adaptive convolutions/YOLOv8

分类

信息技术与安全科学

引用本文复制引用

山宏刚,倪奕麟,蔡建刚,朱军,廖泽威,戚顺楠..FFD-YOLO:面向小目标与复杂背景的液晶屏缺陷检测[J].液晶与显示,2026,41(2):208-221,14.

基金项目

海关机电类实验室智慧检验检测场景的研究及实践项目(No.2024HK078)Supported by Project of Research and Practice of Intelligent Inspection and Testing Scenarios in Customs Electromechanical Laboratories(No.2024HK078) (No.2024HK078)

液晶与显示

1007-2780

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