高电压技术2026，Vol.52Issue(2)：520-532,13.DOI:10.13336/j.1003-6520.hve.20250652
TMR电流传感器可靠性测试方法与失效退化分析
Reliability Testing Methods and Failure Degradation Analysis for TMR Current Sensors
摘要
Abstract
To comprehensively evaluate the long-term reliability of tunneling magnetoresistance(TMR)current sensors under harsh environments,a multi-stress accelerated testing methodology was established.The test matrix includes high-and low-temperature storage,damp-heat aging,thermal cycling,and electromagnetic disturbance tests,while key perfor-mance drifts and physical failure mechanisms are continuously monitored.The results show that the absolute sensitivity drift is ≤5％after 1 000 h storage at 150 ℃,and the absolute zero-offset drift is ≤3％with no progressive degradation af-ter 1 000 h biased aging at 85 ℃ and 85％relative humidity(RH).No functional failures are observed during thermal cycling(-40 ℃ ↔ 125 ℃)or under electrical fast transient(EFT)and surge stresses.Based on multi-stress lifetime modeling,the lifetime is projected to be decades under typical ambient conditions by translating accelerated-test results to nominal use conditions,meeting long-term reliability requirements for power equipment.Dominant failure modes include material aging at high temperatures,corrosion induced by package degradation in humid environments,and transient die-lectric breakdown during lightning surges.This study provides a scientific basis for TMR sensor lifetime assessment and high-reliability design.关键词
隧穿磁阻/电流传感器/多应力加速老化/可靠性评估/失效机理/寿命预测Key words
tunneling magnetoresistance/current sensor/multi-stress accelerated aging/reliability evaluation/failure mechanism/lifetime prediction引用本文复制引用
王冠鹰,梁先锋,赵鹏飞,邓庚会,程宇心,郭经红..TMR电流传感器可靠性测试方法与失效退化分析[J].高电压技术,2026,52(2):520-532,13.基金项目
国家电网有限公司科技项目(5700-202358704A-3-3-JC).Project supported by Science and Technology Project of SGCC(5700-202358704A-3-3-JC). （5700-202358704A-3-3-JC）
