红水河2026，Vol.45Issue(1)：115-120,6.DOI:10.3969/j.issn.1001-408X.2026.01.021
电子跨接器可控硅老化引发灭磁回路隐性故障机理与防治措施研究
Mechanism and Prevention Measures of Latent Faults in De-Excitation Circuit Caused by Aging of Electronic Crowbar Thyristors
郑鸿1
作者信息
- 1. 广西桂冠电力股份有限公司大化水力发电总厂,广西 大化 530899
- 折叠
摘要
Abstract
Aiming at the accident of de-excitation resistor burnout caused by aging and breakdown of thyristors in the electronic crowbar of the excitation system in a hydropower plant,a full-process case study is carried out.Through fault sequence reconstruction and multi-source data fusion analysis,the three-level fault evolution chain of"device aging-latent conduction-thermal breakdown of resistor"is revealed.A prevention and control system based on full-life-cycle management is proposed,and an AI prediction model for thyristor health status(EHAM v1.0)is constructed.Field application verifies the effectiveness of the model and special detection methods,which can provide systematic technical reference for condition assessment and predictive maintenance of similar equipment.关键词
励磁系统/灭磁回路/可控硅老化/隐性故障/状态监测Key words
excitation system/de-excitation circuit/thyristor aging/latent fault/condition monitoring分类
建筑与水利引用本文复制引用
郑鸿..电子跨接器可控硅老化引发灭磁回路隐性故障机理与防治措施研究[J].红水河,2026,45(1):115-120,6.
