机电工程技术2026，Vol.55Issue(4)：20-26,7.DOI:10.3969/j.issn.1009-9492.2025.00048
基于精益六西格玛方法的液晶屏Mura不良现象改善研究
Research on the Improvement of Mura Defects in LCD Screens Based on Six Sigma Methodology
摘要
Abstract
The Mura defect in liquid crystal displays(LCDs)is a critical factor constraining display quality and market competitiveness.Based on the Lean Six Sigma methodology,the key causes of Mura defects in liquid crystal displays are systematically analyzed through the DMAIC(define,measure,analyze,improve,control)process,and targeted improvement measures are proposed.In the define phase,evaluation criteria and improvement objectives for Mura defects are established.During the measure phase,GR&R(gage repeatability and reproducibility)analysis verified measurement system reliability,identifying lamination flatness and plastic shell deformation as primary variation sources.The analyze phase utilized a fishbone diagram,two-proportion test,and regression analysis,confirming that lamination pressure and plastic shell deformation exhibited significant positive correlations with Mura defect rates(p＜0.05).The improve phase achieved a notable reduction in defect rates by optimizing supplier management,adjusting pressure-holding time,and calibrating equipment.In the control phase,standardized operating procedures and monitoring mechanisms are implemented.Post-implementation,the Mura defect rate decreased from 3.9％to 1.2％,validating the effectiveness of Lean Six Sigma in quality management.The study not only provides a systematic improvement methodology for LCD manufacturers,but also expands the application scenarios of lean tools in quality control for complex manufacturing processes offering a scientific and structured reference framework is offered for addressing similar challenges in the industry.关键词
质量管理/六西格玛/液晶屏Mura不良Key words
quality management/Six Sigma/LCD Mura defects分类
信息技术与安全科学引用本文复制引用
赵丹,张珺,吴玲珑..基于精益六西格玛方法的液晶屏Mura不良现象改善研究[J].机电工程技术,2026,55(4):20-26,7.基金项目
吉林省科技发展计划项目(20230201081GX) （20230201081GX）
