量子电子学报2026，Vol.43Issue(2)：210-217,8.DOI:10.3969/j.issn.1007-5461.2026.02.004
InGaAs SPAD光子符合检测读出电路设计
Design of photon coincidence detection readout circuit based on InGaAs SPAD
摘要
Abstract
In order to suppress the effects of ambient light and the dark count of single-photon avalanche diode(SPAD)on the performance of readout circuits,a readout circuit with photon coincidence detection function was designed for InGaAs SPAD in this work.In the design,the quenching circuit integrates the photon coincidence detection circuit,which can operate in 4 different detection levels according to the intensity of ambient light.Only when the number of pulses detected within the time window reaches a threshold,it is determined to be an effective photon event,which effectively reduces the influence of ambient noise.And the signal to background ratio of the readout circuit can reach 5.44.Additionly,the time-to-digital converter(TDC)in the design adopts a dynamic allocation circuit,which reduces the number of TDCs,and decreases the power consumption and data volume to 62.5%and 60%of a non-dynamic allocation TDC circuit,respectively.The simulation verification results show that,under the SMIC 180 nm BCD process,the TDC can achieve a resolution of 250 ps at different process angles and temperatures through precise control of the delay-locked loop.The worst-case conversion linearity values are as follows:the differential nonlinearity is-0.6 times the least significant bit(LSB),and the integral nonlinearity is 0.2 LSB,both of which are better than±1 LSB.关键词
单光子雪崩二级管/光子符合检测/动态分配/时间数字转换器Key words
single-photon avalanche diode/photon coincidence detection/dynamic allocation/time-to-digital converter分类
数理科学引用本文复制引用
陈力颖,王辰阳,李榜添,曹凌风,程传同..InGaAs SPAD光子符合检测读出电路设计[J].量子电子学报,2026,43(2):210-217,8.基金项目
国家重点研发计划(2018YFA0209000),国家自然科学基金青年项目(61904173) （2018YFA0209000）
