集成电路与嵌入式系统2026,Vol.26Issue(4):41-50,10.DOI:10.20193/j.ices2097-4191.2025.0133
基于边路扫描架构的扫描链诊断算法设计
Scan chain diagnosis and algorithm design based on sideway scan
摘要
Abstract
With the increasing complexity and integration levels of integrated circuits,Diagnosis-Driven Yield Analysis(DDYA)has be-come increasingly important in accelerating physical failure analysis and improving yield.However,the low diagnostic resolution of scan chain diagnosis based on scan testing remains a weak link in DDYA.This thesis studies a scan chain diagnosis based on hardware archi-tecture improvement-sideway scan.This technique groups scan chains through clock domain or layout constraints and introduces a cyclic shift sideway transmission path between adjacent scan chains within each group.By transmitting data from the faulty chain to the normal chain and then unloading it,followed by analysis using the sideway diagnostic algorithm,the technique enables precise diagnosis of vari-ous fault scenarios.This architecture offers lower hardware overhead compared to the two-dimensional scan and higher diagnostic reso-lution compared to the bidirectional scan.Comparative experiments across multiple circuits demonstrate that,compared to software-based scan chain diagnosis,Sideway Scan achieves up to 41%improvement in single-fault diagnosis resolution,up to 80%in double-fault diagnosis,and up to 168%in triple-fault diagnosis.Meanwhile,in various fault scenarios,diagnosis time is reduced by over 90%,with the maximum reduction reaching 99%.The study demonstrates the feasibility,stability,time advantage,and diagnostic resolution advantage of the sideway scan,providing a more efficient and precise solution for fault diagnosis in complex integrated circuits.关键词
扫描链诊断/故障诊断/诊断算法/测试向量/边路扫描Key words
scan chain diagnosis/fault diagnosis/diagnosis algorithm/test pattern/sideway scan分类
信息技术与安全科学引用本文复制引用
王奇涛,冯浩然,劳俊杰,游佳欣,林泽凡,赖李洋..基于边路扫描架构的扫描链诊断算法设计[J].集成电路与嵌入式系统,2026,26(4):41-50,10.基金项目
国家自然科学基金项目(92473203) (92473203)
广东省扬帆计划紧缺拔尖人才项目(140-14600602) (140-14600602)