首页|期刊导航|Nano Research|Selectivity and stability reshaping high-sensitivity detection boundaries:A technical leap and paradigm shift in semiconductor surface-enhanced Raman scattering
Selectivity and stability reshaping high-sensitivity detection boundaries:A technical leap and paradigm shift in semiconductor surface-enhanced Raman scattering
Jie Lin Xiangyu Meng Yujiao Xie Yusi Peng Xingce Fan Kun Liang Fugang Xu Aiguo Shen Libin Yang Lei Chen Wei Ji Tingting Zheng Teng Qiu Shan Cong Zhigang Zhao Xiaotian Wang Yong Yang Aiguo Wu Guangcheng Xi Bing Zhao
Nano Research2026,Vol.19Issue(3):P.990-994,5.
Nano Research2026,Vol.19Issue(3):P.990-994,5.DOI:10.26599/NR.2026.94908347
Selectivity and stability reshaping high-sensitivity detection boundaries:A technical leap and paradigm shift in semiconductor surface-enhanced Raman scattering
摘要
关键词
surface-enhanced Raman scattering/semiconductor/enhancement strategies/bio-sensing/cancer diagnosis分类
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Jie Lin,Xiangyu Meng,Yujiao Xie,Yusi Peng,Xingce Fan,Kun Liang,Fugang Xu,Aiguo Shen,Libin Yang,Lei Chen,Wei Ji,Tingting Zheng,Teng Qiu,Shan Cong,Zhigang Zhao,Xiaotian Wang,Yong Yang,Aiguo Wu,Guangcheng Xi,Bing Zhao..Selectivity and stability reshaping high-sensitivity detection boundaries:A technical leap and paradigm shift in semiconductor surface-enhanced Raman scattering[J].Nano Research,2026,19(3):P.990-994,5.基金项目
support from the National Natural Science Foundation of China(Nos.12374390,12274018,52473250,and 52501244). (Nos.12374390,12274018,52473250,and 52501244)