广西科技大学学报2026，Vol.37Issue(4)：50-57,8.DOI:10.16375/j.cnki.cn45-1395/t.2026.04.007
基于机器视觉的芯片电阻歪斜和偏移检测方法研究
A machine vision-based method for skew and offset detection of chip resistors
摘要
Abstract
In the electronics manufacturing industry,the skewing and misalignment of chip resistors significantly affect the performance of circuits and the reliability of entire electronic products.To enhance the precision and efficiency of detection,this study proposed an automated detection method based on machine vision.The method integrated Hu invariant moments and affine transformation techniques to improve the accuracy and robustness of detection,especially when there were significant variations in the position and orientation of the components.The research initially explained the principle of image matching based on Hu invariant moments and utilized these moments for template matching.Subsequently,it elaborated on the application of affine transformations in correcting chip resistor images,including translation,rotation,and scaling.The effectiveness of the proposed method was validated through experiments and applied in practical production.The results demonstrate that the method can effectively enhance the accuracy and robustness of chip resistor skewing and misalignment detection.Finally,the study discussed the limitations of the method and potential directions for future improvement,offering a new solution for high-precision detection of chip resistors in modern electronics manufacturing.关键词
机器视觉/芯片电阻检测/Hu不变矩/仿射变换/图像匹配/自动化检测系统Key words
machine vision/chip resistor inspection/Hu invariant moments/affine transformation/image matching/automated inspection system分类
信息技术与安全科学引用本文复制引用
于海,潘盛辉,汤伟..基于机器视觉的芯片电阻歪斜和偏移检测方法研究[J].广西科技大学学报,2026,37(4):50-57,8.基金项目
广西自然科学基金项目(2018GXNSFAA138122)资助 （2018GXNSFAA138122）
