红外技术2026，Vol.48Issue(8)：953-959,7.
VOx薄膜电阻热滞特性研究
Research on Resistance Thermal Hysteresis Characteristics of VOx Thin Film
王思敏 1于瑞涛 1张体强 1赖建军 2迟宗涛 1王彬1
作者信息
- 1. 青岛大学 电子信息学院(微纳技术学院),山东 青岛 266071
- 2. 华中科技大学 武汉光电国家研究中心,湖北 武汉 430074
- 折叠
摘要
Abstract
Vanadium oxide(VOx)is a highly correlated electronic material.Because of the nonlinear hysteresis characteristics of the metal-semiconductor phase transition,its thermoelectric performance has high research value.VOx thin films are widely used in space exploration,artificial intelligence(AI),and medical treatment because of their many applications in infrared devices,spatial light modulators,optical memories,optical information processors,and other optoelectronic devices.This study investigated the thermal hysteresis curves of the thermoelectric characteristics of VOx thin films.A data model was established based on the resistance and temperature characteristics of these VOx films,along with the Preisach theory.The temperature rise and fall characteristics of the VOx films under this theoretical framework were studied by establishing a discrete Preisach triangle array,and the experimental data were simulated and fitted.The results showed that the calculated thermal hysteresis loop matched well with the experimental data for the VOx films.关键词
氧化钒/相变特性/热滞曲线Key words
VOx/phase transition characteristics/thermal hysteresis curve分类
数理科学引用本文复制引用
王思敏,于瑞涛,张体强,赖建军,迟宗涛,王彬..VOx薄膜电阻热滞特性研究[J].红外技术,2026,48(8):953-959,7.
