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基于COMSOL的高纯氢氟酸中痕量As3+氧化脱除模拟

戴雪凡 郭其景 杨华春 刘海霞 薛峰峰 易浩 宋少先

化学工程2026,Vol.54Issue(8):30-36,7.
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化学工程2026,Vol.54Issue(8):30-36,7.DOI:10.3969/j.issn.1005-9954.2026.08.006

基于COMSOL的高纯氢氟酸中痕量As3+氧化脱除模拟

COMSOL-based simulation of oxidative removal of trace amounts of As3+from hydrofluoric acid

戴雪凡 1郭其景 1杨华春 2刘海霞 2薛峰峰 2易浩 1宋少先1

作者信息

  • 1. 武汉理工大学资源与环境工程学院,湖北武汉 430070
  • 2. 多氟多新材料股份有限公司,河南焦作 454006
  • 折叠

摘要

Abstract

An efficient and environmentally friendly purification process for high-purity HF(hydrofluoric)acid,a critical raw material in the semiconductor and electronics industries,is developed.Existing methods for removing As3+impurities face challenges such as secondary contamination,discontinuous operation,and high costs.To address these limitations,a F2/N2 mixed gas was employed as an oxidizing agent to convert trace As3+into volatile AsF5,and separation was achieved based on the differences in volatility between AsF5 and hydrofluoric acid.A numerical model of the oxidation tower was developed in COMSOL to evaluate the effects of tower geometry and operational parameters on As3+removal efficiency.The results demonstrate that optimal performance is achieved under the following conditions:an inlet As3+mass fraction of 5 × 10-6,F2/N2 molar ratio of 0.2,gas flow rate of 60 L/h,and the use of staggered semi-circular baffles.Under these optimized parameters,the outlet As3+concentration is reduced to 4.303 4 × 10-11 mol/m3.This work provides a theoretical foundation for implementing continuous arsenic removal in high-purity HF production.

关键词

高纯氢氟酸/数值模拟/痕量As3+除杂/结构优化/最优工况

Key words

high-purity hydrofluoric acid/numerical simulation/trace As3+decontamination/structural optimization/optimal operating conditions

分类

化学化工

引用本文复制引用

戴雪凡,郭其景,杨华春,刘海霞,薛峰峰,易浩,宋少先..基于COMSOL的高纯氢氟酸中痕量As3+氧化脱除模拟[J].化学工程,2026,54(8):30-36,7.

基金项目

国家重点研发计划项目(2022YFC2904805) (2022YFC2904805)

化学工程

1005-9954

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