高压电器2026，Vol.62Issue(9)：1-14,32,15.DOI:10.13296/j.1001-1609.hva.2026.09.001
GIS/GIL绝缘件潜隐性缺陷形成机理与无损检测技术研究进展
Research Progress on Formation Mechanisms of Latent Defects and Non-destructive Testing Techniques for GIS/GIL Insulators
摘要
Abstract
Epoxy resin insulating parts(insulating spacers,post insulators,etc.)in gas insulated switchgear(GIS)and gas insulated transmission lines(GIL)are critical core parts of the equipment,and their long-term operational re-liability faces severe challenges.Latent defects formed during the manufacturing stage(such as superficial defects,interface defects,and residual stress defects)are the main causes causing cracking,breakdown,and even rupture of insulating parts.While,the conventional factory tests,including withstand voltage partial discharge test,X-ray in-spection,and hydrostatic pressure test,are severely inadequate in detecting such defects.In this paper the formation mechanisms of these three types of latent defects are systematically reviewed,with emphasis placed in the key induc-ing factors such as bubble nucleation,filler sedimentation,and interfacial stress mismatch.Moreover,the principles,applicability,and engineering bottlenecks of such novel non-destructive testing techniques as terahertz time-domain spectroscopy,laser ultrasound,and the acoustoelastic effect are reviewed.The research indicates that existing detec-tion techniques have significant blind spots.Although emerging detection methods show potential,they still face chal-lenges in terms of detection efficiency,penetration depth,and adaptability to complex structures.Future efforts should be directed toward systematic research along the main line of"mechanism clarification-detection break-through-inhibition optimization",so as to provide theoretical support and technical pathways for improving the manu-facturing quality of insulation components and the intrinsic safety of equipment.关键词
气体绝缘组合电器/气体绝缘金属封闭输电线路/盆式绝缘子/潜隐性缺陷/无损检测Key words
GIS/GIL/insulating spacer/latent defects/nondestructive detection引用本文复制引用
贺春,李进,何金,赵思源,杨志超,陈允,段晓辉,段启超,王宁,夏慧..GIS/GIL绝缘件潜隐性缺陷形成机理与无损检测技术研究进展[J].高压电器,2026,62(9):1-14,32,15.基金项目
国家电网公司科技项目(52039925000C-101-ZN). Project Supported by Science and Technology Project of State Grid Corporation of China(52039925000C-101-ZN). （52039925000C-101-ZN）
