液晶与显示2026，Vol.41Issue(8)：1086-1093,8.DOI:10.3724/CJLCD.2026-0120
基于评估因子反演的扭曲液晶聚合物螺距与厚度的同步测量方法
Simultaneous measurement of pitch and thickness in twisted liquid crystal polymer based on evaluation factor inversion
摘要
Abstract
Conventional methods cannot accurately determine the true pitch of cured twisted LCP films and often require sample destruction or prior thickness knowledge.To address this,we propose a method to simultaneously measure pitch and thickness of the LCP film,as well as helical twisting power(HTP)of its chiral dopant.First,we built a simple optical setup to obtain the experimental relative transmittance spectra,and generated theoretical curves by sweeping device parameters.Trend of variation and oscillation extent evaluation factors were introduced to retrieve the best-matching pitch-thickness combination via inversion and subsequently calculate the HTP.Twisted LCP films were prepared by doping the same LCP host with R5011(mass fraction 0.053 2%)and S5011(mass fraction 0.056 9%).The retrieved pitches were 12.4 and 12.0 μm,thicknesses were 4.4 and 4.3 μm,and HTPs were 151.6 and 147.2 μm⁻¹,respectively.Simulated and experimental transmittance curves exhibited excellently consistency over the full inversion range.Polarimetry verification gave a discrepancy in the pitch of<0.2 μm.This method features a simple,non-destructive setup and enables rapid simultaneous inversion of pitch and thickness from a single spectrum,without prior thickness calibration.Thus,our method offers an effective tool for precise design and characterization of twisted LCP devices and accurate determination of HTP for the chiral dopants.关键词
液晶/扭曲/螺距/聚合物薄膜Key words
liquid crystal/twist/pitch/polymer film分类
数理科学引用本文复制引用
查正桃,勾正阳,刘子豪,穆全全,彭增辉,王启东..基于评估因子反演的扭曲液晶聚合物螺距与厚度的同步测量方法[J].液晶与显示,2026,41(8):1086-1093,8.基金项目
国家自然科学基金(No.U2241224,No.U23A20355,No.11974345) （No.U2241224,No.U23A20355,No.11974345）
中国科学院长春光学精密机械与物理研究所创新项目Supported by National Natural Science Foundation of China(No.U2241224,No.U23A20355,No.11974345) （No.U2241224,No.U23A20355,No.11974345）
Innovation Project of the Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences （）
