电子元件与材料2001，Vol.20Issue(1)：1-2，4,3.
电子元件参数漂移的MΦItoft统计模型
MΦItoft statistical model for parametric drift of electronic components
摘要
Abstract
Parametric drift model describes behaviors of components as they drift away from their nominal values. Study on parametric drift behavior is much more
important as reliability is developing toward failure-free or maintenance-freenmoperating. With MΦItoft statistical model, parametric drift behaviors of
electronic components are described, and lifetime of components predicted on the basis of early life measurements. An example is given. (3 refs.)关键词
电子元件/参数漂移/MΦ Itoft统计模型分类
信息技术与安全科学引用本文复制引用
胡恩平,罗兴柏,彭永怀..电子元件参数漂移的MΦItoft统计模型[J].电子元件与材料,2001,20(1):1-2，4,3.
