CT理论与应用研究2000，Vol.9Issue(z1)：44-47,4.
二维电阻率成像研究
2D Resistivity Tomograp1y Study
底青云 1王妙月1
作者信息
- 1. 中国科学院地质与地球物理研究所,北京 100l01
- 折叠
摘要
Abstract
One of the main problems in resistivity tomography is to get Frechet derivative matrix (sensitivity matrix). In this paper we use an integral solution of differential equation to derive a new Frechet derivative matrix for 2D media. Simultaneously the linear equation is formed, we call it "tomography equation". A resistivity image can be gotten through solving the tomography equation with Gaus-Seidel iteration method in which the inner and outer iteration and multistack technique are used at the same time. Synthetic data tests show that the method is reliable and effective, especially the initial model can be homogeneous, hence it reduces the dependency on the initial resistivity model. The image of a high resistivity body is also quite good,but it is very difficult to get good image of single high resistivity body with some other methods.A test on a field data set in ShangQiu of China is also given, it shows there is a high resistivity anomaly in the middle of the profile. The result coincides with field evidences.引用本文复制引用
底青云,王妙月..二维电阻率成像研究[J].CT理论与应用研究,2000,9(z1):44-47,4.
