电子元件与材料2009，Vol.28Issue(8)：62-65,4.DOI:10.3969/j.issn.1001-2028.2009.08.018
外延BiFeO3薄膜的温度特性
The temperature dependence of epitaxial BiFeO3 thin films
摘要
Abstract
Based on the Landau-Devonshire phenomenological theory, the ferroelectric and magnetic properties of multiferroic epitaxial BiFeO3 thin films were investigated by using an effective substrate lattice constant and a temperature function of the magnetic stiffness coefficient. The results show that the magnetization of 70 nm thick thin films first increase and then decrease between 10 ℃ and 731 ℃, and reach the maximum value of 64 569 A/m at 371 ℃. The maximum value of magnetization decreases with the film thickness increasing.The spontaneous polarization and c-axis lattice parameter decrease as well as the piezoelectric coefficient and relative permittivity increases as the film thickness or the temperature is increased.关键词
无机非金属材料/铁电薄膜/理论模拟/极化强度/磁化强度/BiFeO3Key words
non-metallic inorganic material/ferroelectric thin films/theoretic simulation/polarization/magnetization/BiFeO3分类
数理科学引用本文复制引用
郝晓辉,王兴远,梁伟华,刘宝亭,王英龙..外延BiFeO3薄膜的温度特性[J].电子元件与材料,2009,28(8):62-65,4.基金项目
"973"前期研究专项资助项目(No.2007CB16910) （No.2007CB16910）
国家自然科学基金资助项目(No.50572021) （No.50572021）
河北省自然科学基金资助项目(No.E2005000130) （No.E2005000130）
国家人事部留学人员择优资助项目(No.G05-06) （No.G05-06）
教育部留学回国人员科研启动基金资助项目(No.2005-546) （No.2005-546）
河北大学科研基金资助课题(No.Y2007100) （No.Y2007100）
