电子与封装2012，Vol.12Issue(5)：11-13,3.
内嵌于DDS的DAC线性参数测试
Linear Parameter Test Method of DAC Embedded in DDS
张凯虹 1武新郑 1武乾文1
作者信息
- 1. 中国电子科技集团公司第58研究所,江苏无锡214035
- 折叠
摘要
Abstract
This paper focuses on linear parameter test method of DAC embedded in DDS. The advantage of this method is short develop time, low test cost, easy implement on many kinds of equipment. The method also figures out the problem that equipment can＇t direct input signal to the DAC. And this method doesn＇t have a affect on other parameters. Based on LabView, using NI digital I/O board, digital phosphor oscilloscope and other equipments, experiments are conducted to test linear parameters of DAC. NI digital I/O board or digital phosphor oscilloscope capture time domain signal, other equipments finish configuration of chip. Computer controls full flow and output all of test results in order, achieves complete automatization. The experiments demonstrate that this method can achieve precise result, high test efficiency in actual application.关键词
直接数字频率合成/数模转换器/静态参数Key words
direct digital synthesis/digital-to-analog converter/linear parameter分类
信息技术与安全科学引用本文复制引用
张凯虹,武新郑,武乾文..内嵌于DDS的DAC线性参数测试[J].电子与封装,2012,12(5):11-13,3.
