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塑料封装集成电路分层浅析及改善研究

许海渐 陈洪芳 朱锦辉 王毅

电子与封装Issue(10):3-6,27,5.
电子与封装Issue(10):3-6,27,5.

塑料封装集成电路分层浅析及改善研究

Solution of Delamination for Epoxy-mold IC

许海渐 1陈洪芳 1朱锦辉 1王毅1

作者信息

  • 1. 南通富士通微电子股份有限公司,江苏南通226006
  • 折叠

摘要

Abstract

  When the environmental temperature, humidity change, plastic packaging integrated circuit internal different material interface will produce the delamination, delam cause circuit loop open or intermittent bad contact, greatly affect the function of the IC and service life.Packaging BOM (such as:chip/frame/epoxy/resin ) is to determine IC MSL level and delam level of basic, assembly process design, process control method, product to prevent external force damage and thermal stress protection are influencing factors of delamination, BOM combination need to consider the strength between reinforcing material and close to the modulus of thermal expansion, design the chip PO layer reduce the circuit surface concave-conve, frame groove and convex platform design, manufacturing process pollution prevention/anti-oxidation control, etc., are all improve IC products internal delamination effective ideas. DOE is helpful to the complex manufacturing process found the root causes of delamination.

关键词

封装/BOM/SAM/框架/装片胶/分层/研磨

Key words

assembly/BOM/SAM/lead-frame/epoxy/delamination/cross section

分类

信息技术与安全科学

引用本文复制引用

许海渐,陈洪芳,朱锦辉,王毅..塑料封装集成电路分层浅析及改善研究[J].电子与封装,2012,(10):3-6,27,5.

电子与封装

1681-1070

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