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集成电路中接口电路的可靠性设计

吕江萍 陈远金 刘霞 陈超 刘彬

电子与封装Issue(3):41-45,5.
电子与封装Issue(3):41-45,5.

集成电路中接口电路的可靠性设计

Design of I/O Circuit Reliability in IC

吕江萍 1陈远金 1刘霞 1陈超 1刘彬1

作者信息

  • 1. 北方通用电子集团微电子部,江苏苏州215163
  • 折叠

摘要

Abstract

In ICs design, undertaking ESD protect, level shift, circuit drive etc. the function’s circuit constitute an I/O circuit. With Reliability design of I/O circuit increase IC’s reliability. Characteristics that the paper design from the circuit designing, layout designing, and package designing etc. the stage set out. Reliability each stage contents that design, summarize some design important points and design rules. Bring upped the adoption I/O circuit, seal to pack, PCB in conjunction with the design’s method, increasing I/O circuit reliability.

关键词

集成电路/接口电路/可靠性

Key words

IC/I/O circuit/reliability

分类

信息技术与安全科学

引用本文复制引用

吕江萍,陈远金,刘霞,陈超,刘彬..集成电路中接口电路的可靠性设计[J].电子与封装,2014,(3):41-45,5.

电子与封装

1681-1070

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