电子与封装Issue(9)：21-24,4.
基于三模冗余结构的自刷新寄存器设计
Design of Self-relfesh Flip-lfop Based on Triple Module Redundancy
陈钟鹏 1邹巧云 1施斌友 1万书芹1
作者信息
- 1. 中国电子科技集团公司第58研究所，江苏无锡214035
- 折叠
摘要
Abstract
Designed a self-relfesh lfip-lfop which structure has two data latches and a voter circuit is added to the second stage latch. The function of the voter is to output the logic value that corresponds to at least two of its inputs. The new lfip-lfop can be used to the circuit of triple module redundancy to instead of normal lfip-lfop. It fabricated in 0.13μm standard CMOS process occupies a die area of 32.4μm×8.4μm, the dynamic power consumption was 0.072μW·MHz-1, the setup time is 0.1 ns, and the hold time is 0.08 ns. This structure was applied to Triple Module Redundancy can efifciently prevent Single Event Upset, and Experiment results show that Single-Event Effect Error rate lower than 10-5.关键词
单粒子效应/寄存器/辐照效应/辐照加固Key words
single event effect/lfip-lfop/radiation effect/radiation hardened分类
信息技术与安全科学引用本文复制引用
陈钟鹏,邹巧云,施斌友,万书芹..基于三模冗余结构的自刷新寄存器设计[J].电子与封装,2014,(9):21-24,4.
