摘要
Abstract
As one of the world’s most popular new generation of light source, LED has the advantages of high brightness, low heat, long life, non-toxic, recyclable, and so on, it is known as the most promising green lighting source in twenty-first Century. With the wide application of LED, the market demand for LED driver IC is also growing. Therefore, the cycle and accuracy requirements of the IC test link are increasingly high. In order to improve the efficiency of the testing, the IC testing of multi SITE is becoming more and more popular. In the paper, a detailed introduction is made on the parallel test of LED driver chip, and the hardware design and software programming of the 8 positions driver chip are further studied.关键词
LED/多工位/并行测试Key words
LED/multi position/parallel test分类
信息技术与安全科学
