电子与封装Issue(12)：23-26,4.
FIFO SRAM单粒子效应的测试系统设计
The Single Events Effects Monitoring System of FIFO SRAM
刘永灿 1潘滨 1李爱平1
作者信息
- 1. 中国电子科技集团公司第58研究所，江苏 无锡 214035
- 折叠
摘要
Abstract
With the development of aviation and aerospace industry, devices’anti-irradiation performance is becoming more and more important.Therefore, the application testing of the anti-irradiation index has become more critical. Based on FPGA and NI controller, an data acquisition and test system with four channels was designed in this paper.The system was used to monitor SEU effects and SEL effects in FIFO SRAM’s single event experiment. The sampling rate can reach 50MHZ, and the read-write frequency of device can reach 10Mbytes. The system realized the remote monitoring of FIFO SRAM’s single event experiment. In the process of monitoring SEU, both memory’s SEU effects and read-write pointer’s SEU effects were monitored. Thereliability of this system was verified in actual single event effects test.关键词
单粒子效应/存储器测试/NI工控机Key words
the single events effects/memory test/NI controller分类
信息技术与安全科学引用本文复制引用
刘永灿,潘滨,李爱平..FIFO SRAM单粒子效应的测试系统设计[J].电子与封装,2015,(12):23-26,4.
