基于ATE的可编程逻辑器件测试方法OA
The Research of Programmable Logic Device Testing Method Based on the ATE
集成电路发展模式已从软编程、硬编程到软硬双编程方向发展，可编程器件已成为时代主流，对可编程器件的测试需求越来越多。首先介绍了可编程器件的概念和分类，然后针对目前主流的自动测试设备（ATE）做了介绍，接着详细描述了各种可编程器件的测试方法。该方法具有较强的通用性，可广泛应用于各种PLD、PROM、CPLD、FPGA等可编程器件的测试，对于实现可编程器件的产业化测试具有一定意义。
According to the Xu's cycle description of the development rule of integrated circuits, integrated circuit develop from soft programming to hard programming, then to-hard and soft dual programming direction. Programmable device has become the theme of the times, more and more demand for programmable device test, a variety of innovative testing technologies and solutions of the programmable logic device have been published. This paper introduces the con…查看全部>>
解维坤
中国电子科技集团公司第58研究所，江苏无锡 214035
信息技术与安全科学
可编程逻辑器件ISPATE测试
programmable logic devicesISPATEtest
《电子与封装》 2016 (1)
12-15,4
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