电子元件与材料2017，Vol.36Issue(9)：38-42,5.DOI:10.14106/j.cnki.1001-2028.2017.09.009
电容器常见漏电失效模式分析及应用建议
Research for common leakage failure modes of capacitors and suggestions for application
崔德胜 1陈朝杰 1彭磊 1熊盛阳 1高憬楠1
作者信息
- 1. 中国运载火箭技术研究院元器件可靠性中心,北京 100076
- 折叠
摘要
Abstract
A typical case of capacitor leakage fault in recent years was analyzed.The failure mechanism of ceramic capacitors and tantalum electrolytic capacitors were studied.The analysis show that the main causes of leakage current are metal migration and the defects in medium layer.Then a series of selection recommendations,inspection standards and application requirements are proposed from the view of selection,inspection and reliability,in order to improve the reliability of application for aerospace application and other high reliable fields.关键词
瓷介电容器/钽电解电容器/漏电/可靠性/选用/航天Key words
ceramic capacitor/tantalum electrolytic capacitors/leakage/reliability/, selection/aerospace分类
信息技术与安全科学引用本文复制引用
崔德胜,陈朝杰,彭磊,熊盛阳,高憬楠..电容器常见漏电失效模式分析及应用建议[J].电子元件与材料,2017,36(9):38-42,5.
