电子元件与材料2017，Vol.36Issue(12)：16-20,5.DOI:10.14106/j.cnki.1001-2028.2017.12.004
成型压力对CuFeO2陶瓷材料结构和介电性能的影响
Effect of forming pressure onstructureand dielectric properties of CuFeO2 ceramics
摘要
Abstract
CuFeO2ceramics were synthesized by the traditional solid-state reaction method with different forming pressures(10-800MPa). The effects of forming pressure on the crystal structure,micromorphologyanddielectric properties of CuFeO2ceramics were investigatedbyX-ray diffraction (XRD), scanning electron microscopy(SEM) and impedance analyzer. Theexperimentalresults indicate that no phase transitionis observed for all samples, while the micromorphologyisobviouslyinfluenced by theforming pressure.The largest grain sizeandtheclear grain boundaries areobservedin thesampleformed at100MPa.The electric propertiesmeasurementssuggestthat thefrequency stability of permittivityofthe samplescanbe enhancedby properly increasingformingpressure. Thehigher dielectric constant and lower dielectric loss in the sample formed at100 MPa show the improveddielectric properties. The relationship betweenmicrostructureand dielectric properties of CuFeO2sampleswas also discussed.关键词
CuFeO2陶瓷/成型压力/晶体结构/微观形貌/介电常数/介电损耗Key words
CuFeO2ceramics/forming pressures/crystal structure/micromorphology/dielectric constant/dielectric loss分类
信息技术与安全科学引用本文复制引用
谢新宇,代海洋,陈镇平,叶凤娇,谷留停,刘树人..成型压力对CuFeO2陶瓷材料结构和介电性能的影响[J].电子元件与材料,2017,36(12):16-20,5.基金项目
国家自然科学基金资助项目(No. 11675149) （No. 11675149）
