电子元件与材料2018，Vol.37Issue(2)：79-84,6.DOI:10.14106/j.cnki.1001-2028.2018.02.015
基于加速寿命试验的SLD可靠性预计模型研究
Research on reliability prediction model for SLD based on accelerated lifetime test
杨云 1任艳 1于迪 1周军连 1戴泽林1
作者信息
- 1. 工业和信息化部电子第五研究所,广东 广州 510610
- 折叠
摘要
Abstract
Superluminescent diode (SLD) is widely used in aviation, aerospace and other fields. Unfortunately, due to the absence of the prediction model for SLD, few effective guidance for reliability analysis is available. In this paper, the prediction model for SLD was established based on the main failure modes, mechanisms and typical induced stress of SLD. To quantitatively determine the reliability prediction model coefficients of SLD chip, the accelerated lifetime test was carried out, and the methods of reliability estimation based on performance degradation, figure estimation, optimal linear unbiased estimation and least square method were employed for data processing. Moreover, the coupling and internal components model coefficients were characterized on the basis of existing reliability prediction technology of coupling, thermistor and refrigerator. The result provides valuable technical information for reliability analysis of the engineering applications of SLD.关键词
光学器件/超辐射发光二极管/可靠性/预计模型/加速寿命试验/性能退化Key words
optical devices/superluminescent diode (SLD)/reliability/prediction model/accelerated lifetime test/performance degradation分类
信息技术与安全科学引用本文复制引用
杨云,任艳,于迪,周军连,戴泽林..基于加速寿命试验的SLD可靠性预计模型研究[J].电子元件与材料,2018,37(2):79-84,6.
