工业工程2024，Vol.27Issue(3)：22-30,9.DOI:10.3969/j.issn.1007-7375.240053
基于数字孪生的芯片系统级测试装备快速定制设计方法研究
A Rapid Customization Design Method of System-Level Test Equipment for Chips Based on Digital Twins
摘要
Abstract
In order to address the issues of long design cycles for system-level test(SLT)equipment caused by high customization requirements and ineffective reuse of design knowledge,a rapid customization design method for SLT equipment is studied.First,the design knowledge prototype of SLT equipment is developed.Additionally,a framework for rapid design of equipment is proposed,including the design knowledge characterization based on core design parameters and a special aggregation method between mechanical modules,i.e.,"leaning"behavior,which effectively realizes the storage and reuse of design knowledge for such equipment.Then,based on the developed design knowledge prototype,combined with digital twin technology,we use the digital factory simulation platform developed by our team to encapsulate the SLT equipment component library and build the SLT equipment digital twin design prototype.In this way,the 3D design solutions by parameter configuration can be quickly output.Ultimately,the semi-physical in-the-loop simulation technology is adopted for virtual debugging,making designing,manufacturing,and debugging of the equipment to proceed in parallel and verify each other.Compared with traditional methods,the approach proposed in this paper reduces the cycle time by about 30%,the cost by about 40%,and the labor input by about 60%for designing and debugging of such equipment.关键词
SLT装备/数字孪生/快速设计/设计知识表征Key words
SLT equipment/digital twin/rapid design/design knowledge representation分类
管理科学引用本文复制引用
林大钦,赵荣丽,赖苑鹏,刘强..基于数字孪生的芯片系统级测试装备快速定制设计方法研究[J].工业工程,2024,27(3):22-30,9.基金项目
广州市科技计划资助项目(2024A04J6301) （2024A04J6301）
