电子与封装2024，Vol.24Issue(7)：8-14,7.DOI:10.16257/j.cnki.1681-1070.2024.0072
某型运算放大器失效机理研究
Research on Failure Mechanism of a Certain Type of Operational Amplifier
李鹏 1解龙 1刘曦1
作者信息
- 1. 西安现代控制技术研究所,西安 710065
- 折叠
摘要
Abstract
In view of the problem of unqualified test of a certain type of operational amplifier after plastic packaging and fixation in the debugging process of a certain system,the failure mechanism of a certain type of operational amplifier is explored by formulating a failure analysis plan.The electrical parameters of the failed samples are tested.The output voltage is found to be abnormal,the parameters such as bias current and input offset voltage are out of tolerance,and the failure mechanism is preliminarily determined to be electrostatic damage.The I-V characteristic curve testing and comparative analysis are carried out to confirm that the second input port is open to the positive power port.Through X-ray inspection and particle collision noise inspection,the possible defects and movable excess objects that may exist inside the device packaging are investigated.The device is opened to observe the internal structure and layout,and it is found that there are obvious breakdown marks at Pin5.With the maximum withstand voltage as the starting voltage and the step of 100 V,the electrostatic discharge test of the human body model is carried out on the qualified samples,and the failure mechanism of the operational amplifier caused by electrostatic discharge resulting in transistor breakdown and burnout is verified.关键词
运算放大器/参数测试/静电放电/失效分析Key words
operational amplifier/parameter testing/electrostatic discharge/failure analysis分类
信息技术与安全科学引用本文复制引用
李鹏,解龙,刘曦..某型运算放大器失效机理研究[J].电子与封装,2024,24(7):8-14,7.
