电子与封装2024，Vol.24Issue(7)：36-42,7.DOI:10.16257/j.cnki.1681-1070.2024.0082
基于ATE与结构分析的RRAM芯片测试技术研究
Research on RRAM Chip Testing Technology Based on ATE and Structural Analysis
奚留华 1徐昊 1张凯虹 1武乾文 1王一伟1
作者信息
- 1. 无锡中微腾芯电子有限公司,江苏无锡 214035
- 折叠
摘要
Abstract
In order to test the resistive-variable memory(RRAM)chip,the performance,working mode and chip timing are analyzed and summarized based on the basic structure,interface definition and function of the RRAM chip.The capacity of the RRAM chip is measured by combining formula calculation with actual measurement techniques.The results show that the formula calculation based on structural analysis can calculate the capacity of RRAM chips based on the spacing of the RRAM memory cells.An automatic testing system is used to verify the function of the RRAM chip,at the same time,a durability testing device of RRAM chip is designed and the erasing performance of RRAM chip is evaluated comprehensively.关键词
RRAM芯片/ATE/测试算法/结构分析Key words
RRAM chip/ATE/testing algorithm/structural analysis分类
电子信息工程引用本文复制引用
奚留华,徐昊,张凯虹,武乾文,王一伟..基于ATE与结构分析的RRAM芯片测试技术研究[J].电子与封装,2024,24(7):36-42,7.
