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内嵌NPN结构的高维持电压可控硅器件

陈泓全 齐钊 王卓 赵菲 乔明

电子与封装2024,Vol.24Issue(7):75-79,5.
电子与封装2024,Vol.24Issue(7):75-79,5.DOI:10.16257/j.cnki.1681-1070.2024.0081

内嵌NPN结构的高维持电压可控硅器件

High Holding Voltage Silicon-Controlled Rectifier Device with Embedded NPN Structure

陈泓全 1齐钊 1王卓 2赵菲 2乔明3

作者信息

  • 1. 电子科技大学集成电路科学与工程学院(示范性微电子学院),成都 611731||电子科技大学重庆微电子产业技术研究院,重庆 400065
  • 2. 电子科技大学集成电路科学与工程学院(示范性微电子学院),成都 611731
  • 3. 电子科技大学集成电路科学与工程学院(示范性微电子学院),成都 611731||电子科技大学广东电子信息工程研究院,广东东莞 523107
  • 折叠

摘要

Abstract

To address the problems of high trigger voltage,low holding voltage and high latch-up risk in traditional silicon-controlled rectifier(SCR)devices,a high holding voltage SCR device with an embedded NPN structure is proposed.The holding voltage is increased from 1.2 V in traditional device to 10.3 V.Compared with the traditional structure,the new SCR structure has two current paths.The embedded NPN current path delays the turn-on process of the parasitic PNP transistor in the device,suppressing the positive feedback process between the NPN and PNP transistors in the SCR structure,so that the SCR current path can only be fully turned on when the current is large,thereby achieving the purpose of improving the holding voltage.The electrical characteristics of the device under direct current are simulated based on semiconductor device simulation software.The working mechanism of the device is analyzed,and the influence of key device parameters on its electrical characteristics is discussed.

关键词

内嵌NPN结构/静电放电/维持电压/SCR

Key words

embedded NPN structure/electrostatic discharge/holding voltage/SCR

分类

电子信息工程

引用本文复制引用

陈泓全,齐钊,王卓,赵菲,乔明..内嵌NPN结构的高维持电压可控硅器件[J].电子与封装,2024,24(7):75-79,5.

基金项目

四川省重点研发项目(2022YFG0165) (2022YFG0165)

航空科学基金项目(201943080002) (201943080002)

重庆市自然科学基金面上项目(cstc2021jcyj-msxmX1023) (cstc2021jcyj-msxmX1023)

电子与封装

1681-1070

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