GaN载片式功率放大器质量提升研究OA北大核心CSTPCD

With the integration improvement the T/R module,gallium nitride(GaN)die-packaged pallet power amplifier(DP PA)is becoming a new form duo to its high output power,high efficiency and compact size.In this article,a novel reliability and quality evaluate method is researched to adapt the new DP PA.Based on the characteristics of the GaN DP PA,the researched method combines the evaluate method of the monolithic microwave integrated circuit and discrete device and focuses on the core el-ements,such as high power die and matching capacitance.By detailing the screening test,tighten the consistency of quality evalu-ation and accelerated life tests,the unaccepted products can be filtrated in early stage and the quality state can be controlled.In that way,the reliability of the products can be improved.Two GaN DP PA products are utilized to validate the researched method.In the consistency of quality evaluation,the quality issues of the high power die and matched capacitance are found in these two products.The two samples demonstrate the proposed method can significantly enhance the quality of the GaN DP PA.